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Home / programming language / Online Matlab Projects / Input Vector Monitoring Concurrent BIST Architecture Using SRAM Cells
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Input Vector Monitoring Concurrent BIST Architecture Using SRAM Cells

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SKU: PROJ3593 Categories: 2015 Projects, Final Year Projects, Online Matlab Projects Tags: academic projects, Android project 2013-2014, Android project 2015-2016, Android project Abstract, Android project list, btech projects, dotnet project 2013-2014, dotnet project 2015-2016, dotnet project Abstract, dotnet project list, elysium technologies abstract, elysium technologies chennai, elysium technologies coimbatore, elysium technologies company, elysium technologies courses, elysium technologies erode, elysium technologies inpant traning, elysium technologies internship, elysium technologies jobs, elysium technologies madurai, elysium technologies mou, elysium technologies pondychery, elysium technologies projectlist, elysium technologies projects, elysium technologies ramnad, elysium technologies salem, elysium technologies software, elysium technologies tirunelveli, elysium technologies trichy, Final Year Projects, java projects 2013-2014, java projects 2015-2016, java projects Abstract, madurai software company, matlab project 2013-2014, matlab project 2015-2016, matlab project Abstract, matlab project list, mtech projects, phd research work, Php project 2013-2014, Php project 2015-2016, Php project Abstract, Php project list, Power Electronic project 2013-2014, Power Electronic project 2015-2016, Power Electronic project Abstract, Power Electronic project list, project center Bangalore, project center chennai, project center coimbatore, project center Erode, project center Hyderabad, project center Kollam, project center madurai, project center Pandicherry, project center ramnad, project center Salem, project center Tiruneveli, project center trichy, research center, Students Projects, Vlsi project 2013-2014, Vlsi project 2015-2016, Vlsi project Abstract, Vlsi project list
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Input Vector Monitoring Concurrent BIST Architecture Using SRAM Cells

Abstract—Input vector monitoring concurrent built-in self test (BIST) schemes perform testing during the normal operation of the circuit without imposing a need to set the circuit offline to perform the test. These schemes are evaluated based on the hardware overhead and the concurrent test latency (CTL), i.e., the time required for the test to complete, whereas the circuit operates normally. In this brief, we present a novel input vector monitoring concurrent BIST scheme, which is based on the idea of monitoring a set (called window) of vectors reaching the circuit inputs during normal operation, < Final Year Projects > and the use of a static-RAM-like structure to store the relative locations of the vectors that reach the circuit inputs in the examined window; the proposed scheme is shown to perform significantly better than previously proposed schemes with respect to the hardware overhead and CTL tradeoff.

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