Abstract—In a broadband MIMO-OFDM wireless communication system, embedded buffering memories occupy a large portion of the chip area and a significant amount of power consumption. Due to process variations of advanced CMOS technologies, it becomes both challenging and costly to maintain perfectly functioning memories under all anticipated operating conditions. Thus, < Final Year Projects > Voltage over Scaling (VoS) has emerged as a means to achieve energy efficient systems resulting in a tradeoff between energy efficiency and reliability. In this paper we present the algorithm and VLSI architecture of a novel error-resilient K-Best MIMO detector based on the combined distribution of channel noise and induced errors due to VoS. The simulation results show that, compared with a conventional MIMO detector design, the proposed algorithm provides up-to 4.5 dB gain to achieve the near-optimal Packet Error Rate (PER) performance in the 4 × 4 64-QAM system. Furthermore, based on experimental results, when jointly considering the detector and memory power consumption, the proposed resilient scheme with VoS memory can achieve up to 32.64% savings compared to the conventional K-Best detector with perfect memory.
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