Product Description
A Low-Voltage Radiation-Hardened 13T SRAM Bitcell for Ultralow Power Space Applications
Abstract— Continuous transistor scaling, coupled with the growing demand for low-voltage, low-power applications, increases the susceptibility o f VLSI circuits to soft-errors, especially when exposed to extreme environmental conditions, such as those encountered by space applications. The most vulnerable of these circuits are memory arrays that cover large areas of the silicon die and often store critical data. < final year projects >
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