Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories
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Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories
Abstract— Error correction code (ECC) and built-in self-repair (BISR) techniques by using redundancies have been widely used for improving the yield and reliability of embedded memories. The target faults of these two schemes are soft errors and permanent (hard) faults, respectively. < final year projects >
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