Stochastic Resource Provisioning for
Container ized Multi-Tier Web Ser vices in Clouds
Abstract-The increasing need for high-speed logic circuits is causing the conventional flip-flop (FF) designs to migrate to differential FF designs. With the small magnitude of input voltages (and the resulting small noise margins) needed for proper operation, sense-amplifier based FF designs (SAFF) are susceptible to single-event effects (SEE). Single event upset (SEU) performance of high-speed SAFF designs is investigated in this paper for 16-nm bulk FinFET CMOS technology. SEU crosssections for SAFF are evaluated over particle LET, temperature, and operating frequency. Results show significant increases in cross-sections as a function of frequency, but not so for temperature. Results presented in this work can guide designers to harden the SAFF that satisfies their specific circuit SEU error rate constraints.
sales on Site11,021