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A Low Area Overhead NBTI/PBTI Sensor for SRAM Memories Abstract-Bias temperature instability (BTI) is known as one serious reliability concern in nanoscale technologies. BTI gradually increases the absolute value of threshold voltage (Vth) of MOS transistors. The main consequence of Vth shift of the SRAM cell transistors is the static noise margin (SNM) degradation. The…
A Multi-Objective Optimization Technique to Develop Protection Systems of Distribution Networks with Distributed Generation Abstract-This paper presents a new methodology based on multi-objective optimization techniques to perform an optimized, coordinated and selective allocation of control and protection devices in distribution networks with distributed generation (DG). The proposed mathematical model consists of two objective functions that…
A Reliable Three-Phase Transformerless Grid-Connected PV Inverter With Inductive DC Link Abstract-In this paper, a modi?ed buck?boost grid-connected three-phase photovoltaic inverter is presented. In the structure of inverter, an inductive dc link is used between the input and output. The merits of the employed inverter are soft switching and step-up/down conversion without any additional power…
Rollback Mechanisms for Cloud Management APIs using AI planning Abstract-Human-induced faults play a large role in systems reliability. In cloud platforms, system administrators may inadvertently make catastrophic mistakes, like deleting a virtual disk with important data. Providing rollback for cloud operations can reduce the severity and impact of such mistakes, by allowing to revert to…
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